Renesas Electronics Corporation Patent Portfolio Statistics

Renesas Electronics Corporation

Profile Summary

This article summarizes the perfomance of the assignee in the recent years. The overall statistics for this portfolio help to analyze the areas where the assignee is performing well. The filing trend, perfomance across the tech centers and the perfomance of the recent applications has been mentioned below. All the stats are calculated based on the perfomance in USPTO.

How does the overall patent portfolio of Renesas Electronics Corporation look like?

Total Applications: 18,416
Granted Patents: 16,344
Grant Index 89.68 %
Abandoned/Rejected Applications: 1,880 (10.32%)
In-Process Applications: 184
Average Grant Time: 2.32 Years
Average Office Actions: 1.21

Which Technology Area Renesas Electronics Corporation is filing most patents in? (Last 10 years)

Art Unit Definition Total Applications
2818 Semiconductors/Memory 1,329
2816 Semiconductors/Memory 884
2824 Semiconductors/Memory 878
2827 Semiconductors/Memory 715
2814 Semiconductors/Memory 664

How many patents are Renesas Electronics Corporation filing every year?

Year Total Applications
2022 0*
2021 66*
2020 169
2019 248
2018 346

*The drop in the number of applications filed in last two years compared to previous years is because applications can take up to 18 months to get published

Recently filed patent applications of Renesas Electronics Corporation in USPTO?

Publication number: US20220027225A1
Application number: 17/494,630

A semiconductor device has a timer unit and a processing unit. The timer unit includes a binary counter, a first converter that converts a first count value output from the binary counter to a gray code to output as first gray code data. The processing unit includes a first synchronizer that captures the first gray code data transferred from the timer unit in synchronization with the system clock signal and outputs the captured first gray code data as second gray code data, and a fault detection unit that generates a data for fault detection based on the first gray code data transferred from the timer unit and compares a second count value based on the second gray code data with a third counter value based on the data for fault detection.

Publication date: 2022-01-27
Applicant: Renesas Electronics Corporation
Inventors: Hayase Kiyoshi

Publication number: US20220013508A1
Application number: 17/486,301

Reliability of a semiconductor device is improved. The semiconductor device PKG1 includes a wiring substrate SUB1, a semiconductor chip CHP1 and a capacitor CDC mounted on the upper surface 2 t of the wiring substrate SUB1, and a lid LD formed of a metallic plate covering the semiconductor chip CHP1 and the wiring substrate SUB1. The semiconductor chip CHP1 is bonded to the lid LD via a conductive adhesive layer, and the capacitor CDC, which is thicker than the thickness of the semiconductor chip CHP1, is disposed in the cut off portion 4 d 1 provided in the lid LD, and is exposed from the lid LD.

Publication date: 2022-01-13
Applicant: Renesas Electronics Corporation
Inventors: Akiba Toshihiko

Publication number: US20220005804A1
Application number: 17/476,099

A semiconductor device with an insulated-gate field-effect transistor and its manufacturing method. The cell region EFR defined in the first region of one main surface side of semiconductor substrate (SUB), an insulated gate-type field-effect transistor (MFET) is formed, the gate pad region GPR defined in the first region, snubber circuit SNC is formed snubber region SNR is defined. Within the first and second regions, first and second deep trenches spaced apart from each other are formed, and at least one width of the plurality of second deep trenches formed in the second region is smaller than that of the first deep trench formed in the first region.

Publication date: 2022-01-06
Applicant: Renesas Electronics Corporation
Inventors: Fujio Shimizu

How are Renesas Electronics Corporation’s applications performing in USPTO?

Application Number Title Status Art Unit Examiner
17/494,630 Semiconductor Device And System Using The Same OPAP Central, Docket
17/486,301 Semiconductor Device Including A Circuit For Transmitting A Signal OPAP Central, Docket
17/476,099 Semiconductor Device And Method Of Manufacturing The Same Docketed New Case – Ready for Examination OPAP Central, Docket
17/474,914 Power Line Communication Device Docketed New Case – Ready for Examination OPAP Central, Docket
17/400,918 Memory Protection Circuit And Memory Protection Method Docketed New Case – Ready for Examination OPAP Central, Docket